One hardware-native ontology.

Every design artifact joins one graph, and three agent modules — Structure, Generate, Verify — run on top of it. Below, what each module takes in and what it puts out.

Messy in. Structured out.

Unstructured design artifacts — documents, datasheets, diagrams, RTL — are parsed into structured design data where every value carries its source page. Diagrams become graphs of nodes and connections; RTL becomes an IP hierarchy.

Input — datasheet, as published

LM124 datasheet page 1

Philips LM124 family — public datasheet

Structured spec

100% source-linked
  • supply_voltagep.1

    3 – 30 V

  • gain_dcp.1

    100 dB

  • pinsp.1

    14 — OUT · IN± · V+ · GND

  • packagep.1

    DIP-14 · SO-14

Functional hierarchy

netlist-ready
  • TOP — LM124 · quad op amp
  • AMP ×4 — identical amplifier blocks
  • INPUT — Q1–Q4 differential pair
  • GAIN — Q10–Q12 · Cc
  • OUTPUT — Q5–Q7 · Q13
  • BIAS — 6 µA · 100 µA current sources

Requirements in. Block diagram out.

A reasoning model reads each requirement and updates the architecture tree as it goes, assembles the architecture from circuit blocks proven in past designs, then pins a real, purchasable part to every block against datasheet parameters.

Input — five natural-language requirements

  • R112 V battery direct input, reverse-polarity protected
  • R24-channel sensor amplification, 12-bit ADC
  • R3Operating temperature −40 to +125 °C
  • R4CAN FD link, 100 ms status cycle
  • R5Standby current ≤ 5 mA

Reasoning log

  • › R1 → reverse-polarity P-FET + TVS, buck to 5 V rail
  • › R2 → quad op amp + 12-bit ADC on MCU
  • › R3 → automotive-grade constraint on every block
  • › R4 → CAN FD transceiver + termination
  • › R5 → supervisor / watchdog, low-Iq LDO

Output — architecture → parts pinned

parts verified
Sensor Interface ECUPowerAnalog Front-EndControlCommunicationReverse Prot.P-FETBuck 5.0 VBuck 5V0LDO 3.3 VLDO 3V3EMI / RCπ-FilterAmp 4chLM2902MCU + ADCRH850SVS / WDTSVS+WDTCAN FDCAN FD XCVRConn + ESDConn+ESDBlock diagram finalized — every block maps to a real part

Candidates — Quad Op Amp

R3: −40 ~ +125 °C
  • LM3244ch0 ~ +70 °Crejected — temp range
  • LM2244ch−25 ~ +85 °Crejected — temp range
  • SA5344ch−40 ~ +85 °Crejected — temp range
  • LM29024ch−40 ~ +125 °Cselected · automotive grade

Errors caught before they ship.

Test cases are generated from each requirement; design rules become automatically checkable assertions, verified one by one. Regression runs against the product line's defect history, and failure-mode analysis (FMEDA) surfaces faults the system cannot detect. Every verdict cites its evidence.

DUT — design under test

2 logical design errors · 1 undetectable fault
VBATP-FETBuck 5V0LDO 3V3Op AmpMCU32-bit · ADCSVS / WDTCAN XCVRCAN Conn
RTL — ECU_STATUS_CTRL.v
module ecu_status_ctrl (input clk_16m, nrst, input [3:0] adc_in,
  output can_tx, input can_rx, output wdt_kick);
  assign wdt_kick = |adc_in; // nrst: open-drain, pull-up unbound
endmodule

Test cases — generated from R1–R5

  • TC-01reverse battery −12 V · 60 s hold · no damagefrom R1
  • TC-024-ch ADC sweep · 12-bit code integrityfrom R2
  • TC-03temp corners −40 / +25 / +125 °C functionalfrom R3
  • TC-04CAN FD status frame period 100 msfrom R4

Assertions — design rules as checks

  • assert (nrst has pull-up)pass
  • assert (wdt_kick within 100 ms)fail
  • assert (can_h / can_l terminated 120 Ω)fail

FMEDA — failure mode, effects & diagnostic analysis

ElementFailure modeEffectDiagnosticStatus
Q1 P-FETshortloss of reverse protectionnoneUndetected
U1 Buckoutput drift5V0 overvoltageU6 supervisorDetected

We are building a design-specialized foundation model that understands requirements through physical layout.

Training data

  • RTLBehavior · control

    always @(*) begin
      if (a) y = b & c;
      else   y = d | e;
    end
  • NetlistFlattened · gates · nets

    wire n1, n2;
    AND2_X1 g1 (.A1(b), .A2(c), .ZN(n1));
    OR2_X1  g2 (.A1(d), .A2(e), .ZN(n2));
    MUX2_X1 g3 (.S(a), .A(n2), .B(n1), .Z(y));
  • LayoutArea · placement · routing

    die 2.4 × 1.6 mm
    macro A0 @ (120, 80) rot 0
    M3 route n1: (12,4)→(48,4)
    via M2/M3 @ (48,4)

Circuit Foundation Model

Logical view

Logical representation

Physical view

Physical representation

Requirements → logic → physical, joined in one representation space

Enterprise design workflow · on-premises

  • Design generation
  • Cross-domain check
  • Adapts & learns on in-house data

Logical and physical views of the same circuit meet in one model space — any divergence is caught as a logical design error.

Agents execute.
Engineers lead.

A handful of sample artifacts is enough. We will show you what gets caught in your own data.

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